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X-Ray Fluorescence Analyser ComPact 5/PIN

The ComPact 5/PIN offers a universal material and coating thickness analyser at a reasonable price/ performance ratio. The use of a high resolution Silicon Semiconductor detector makes the ComPact 5/PIN an ideal tool for users who want best limits of detection and highest precision together with maximum flexibility. Compared with a conventinal prop.- counter the Semiconductordetector offers about 4 times better energy resolution. This gives much better separation of overlapping elements. The much higher peak/ background ratio of the detector allows the analysis of very thin coatings, about 10 times thinner as so far possible. A very comprehensive library of software tools allows the analysis of bulk as well as liquid samples ( plating bath ). Multiple layer alloy coatings on complex base materials can be analysed as well.This makes the ComPact 5/PIN the ideal tool for the electronic industry.